Academic Aptitude Test
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The Academic Aptitude Test[1] (AAT; Template:Lang-zh) is a test conducted by the Hong Kong Education Department from 1978 to 2000 in conjunction with the Secondary School Place Allocation System. The candidates of the test were students studying in the sixth grade of primary schools.
Before the abolishment of the test in 2000, this test, together with the Hong Kong Certificate of Education Examination and the Hong Kong Advanced Level Examination, were known as the three major public examinations in Hong Kong.
History
The test was designed to create a common ground in measuring different school systems and began in 1978 as part of the Secondary School Places Allocation (SSPA) scheme. HKAAT aimed to test student logic, reasoning, and classification ability.
References
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