http://debianws.lexgopc.com/wiki143/index.php?action=history&feed=atom&title=Scanning_gate_microscopyScanning gate microscopy - Revision history2026-05-13T02:10:45ZRevision history for this page on the wikiMediaWiki 1.43.1http://debianws.lexgopc.com/wiki143/index.php?title=Scanning_gate_microscopy&diff=2619253&oldid=prev205.175.106.232: /* Development */2022-03-16T21:39:34Z<p><span class="autocomment">Development</span></p>
<p><b>New page</b></p><div>'''Scanning gate microscopy''' ('''SGM''') is a [[scanning probe microscopy]] technique with an electrically conductive tip used as a movable gate that couples capacitively to the sample and probes electrical transport on the [[nanometer]] scale.<ref name="SellierHackens2011">{{cite journal|last1=Sellier|first1=H|last2=Hackens|first2=B|last3=Pala|first3=M G|last4=Martins|first4=F|last5=Baltazar|first5=S|last6=Wallart|first6=X|last7=Desplanque|first7=L|last8=Bayot|first8=V|last9=Huant|first9=S|title=On the imaging of electron transport in semiconductor quantum structures by scanning-gate microscopy: successes and limitations|journal=Semiconductor Science and Technology|volume=26|issue=6|year=2011|pages=064008|issn=0268-1242|doi=10.1088/0268-1242/26/6/064008|arxiv=1104.2032|bibcode=2011SeScT..26f4008S}}</ref><ref name="GoriniJalabert2013">{{cite journal|last1=Gorini|first1=Cosimo|last2=Jalabert|first2=Rodolfo A.|last3=Szewc|first3=Wojciech|last4=Tomsovic|first4=Steven|last5=Weinmann|first5=Dietmar|title=Theory of scanning gate microscopy|journal=Physical Review B|volume=88|issue=3|year=2013|issn=1098-0121|doi=10.1103/PhysRevB.88.035406|arxiv=1302.1151|bibcode=2013PhRvB..88c5406G}}</ref> Typical samples are [[mesoscopic]] devices, often based on [[semiconductor]] [[heterostructure]]s, such as quantum point contacts or [[quantum dot]]s. [[Carbon nanotube]]s too have been investigated.<br />
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==Operating principle==<br />
In SGM one measures the sample's [[electrical conductance]] as a function of tip position and tip potential. This is in contrast to other microscopy techniques where the tip is used as a sensor, e.g., for forces. <br />
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==Development==<br />
SGMs were developed in the late 1990s from [[atomic force microscope]]s. Most importantly, these had to be adapted for use at low temperatures, often 4 [[kelvin]]s or less, as the samples under study do not work at higher temperatures. Today an estimated number of eleven research groups worldwide use the technique.<br />
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== References ==<br />
{{reflist}}<br />
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{{SPM2}}<br />
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[[Category:Scanning probe microscopy]]</div>205.175.106.232