http://debianws.lexgopc.com/wiki143/index.php?action=history&feed=atom&title=Process_control_monitoringProcess control monitoring - Revision history2026-09-15T11:27:36ZRevision history for this page on the wikiMediaWiki 1.43.1http://debianws.lexgopc.com/wiki143/index.php?title=Process_control_monitoring&diff=5883436&oldid=previmported>JoeNMLC: ce, add "process control monitoring" cite; rm unref. tag; add ref. section2024-03-21T21:35:04Z<p>ce, add "process control monitoring" cite; rm unref. tag; add ref. section</p>
<p><b>New page</b></p><div>In the application of [[integrated circuits]], '''process control monitoring''' ('''PCM''')<ref>{{Cite web|date=2019-05-14|title=A Guide To Statistical Process Control|url=https://redmeters.com/a-guide-to-statistical-process-control/|access-date=2021-03-29|website=Red Meters|language=en-US}}</ref> is the procedure followed to obtain detailed information about the process used.<br />
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PCM is associated with designing and fabricating special structures that can monitor technology specific parameters such as V<sub>th</sub> in [[CMOS]] and V<sub>be</sub> in bipolars. These structures are placed across the wafer at specific locations along with the chip produced so that a closer look into the process variation is possible.<br />
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==References==<br />
{{Reflist}}<br />
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[[Category:Integrated circuits]]<br />
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{{technology-stub}}</div>imported>JoeNMLC